i/iv be/b.tech. - Andhra University

4-Years B.TECH
COMPUTER SCIENCE ENGINEERING




WITH EFFECT FROM 2010-11 ADMITTED BATCH

SYLLABI
(Tentative)





CHAIRMAN
BOARD OF STUDIES










DEPARTMENT OF COMPUTER SCIENCE AND SYSTEMS ENGINEERING
COLLEGE OF ENGINEERING
ANDHRA UNIVERSITY
VISAKHAPATNAM-3



ANDHRA UNIVERSITY
COLEGE OF ENGINEERING - AUTONOMOUS
VISAKHAPATNAM

COMMON SCHEME OF INSTRUCTION AND EXAMINATION WITH EFFECT FROM 2010-11
ADMITTED BATCH




I/IV B.E./B.TECH. (FOUR YEAR COURSE) - SEMESTER SYSTEM

I & II SEMESTERS

|CODE NO.|COURSE |CREDIT| |Exam.|Session|Exam |Tota|
| | |S |PERIODS| |al |Marks|l |
| | | | |Hours|Marks | |Mark|
| | | |L/T/Lab| | | |s |
| | | |. | | | | |
|ENG |ENGLISH |2 |2 + 1 |3 |30 |70 |100 |
|1001 | | | | | | | |
|ENG |MATHEMATICS-I |4 |3 |3 |30 |70 |100 |
|1002 | | | | | | | |
|ENG |MATHEMATICS-II |4 |3 |3 |30 |70 |100 |
|1003 | | | | | | | |
|ENG |PHYSICS THEORY |4 |3 |3 |30 |70 |100 |
|1004 | | | | | | | |
|ENG |CHEMISTRY THEORY |4 |3 |3 |30 |70 |100 |
|1005 | | | | | | | |
|ENG |HISTORY OF SCIENCE AND |2 |3 |3 |30 |70 |100 |
|1006 |TECHNOLOGY | | | | | | |
|ENG |COMP. PROG. & NUM. METHODS |4 |3 |3 |30 |70 |100 |
|1007 | | | | | | | |
|ENG |ENGINEERING GRAPHICS |5 |2 + 4 |3 |30 |70 |100 |
|1008 | | | | | | | |
|ENG |PHYSICS LABORATORY |2 |-- |3 |50 |50 |100 |
|1009 | | | | | | | |
|ENG |CHEMISTRY LABORATORY |2 |-- |3 |50 |50 |100 |
|1010 | | | | | | | |
|ENG |WORKSHOP |2 |-- |3 |50 |50 |100 |
|1011 | | | | | | | |
|ENG |PROGRAMMING LABORATORY |2 |-- |3 |50 |50 |100 |
|1012 | | | | | | | |
| |TOTAL |37 |39 | |440 |760 |1200|

II/IV B.TECH.(CSE) I - SEMESTER
|B.TECH. (CSE) 2nd YEAR I -SEMESTER SCHEME OF INSTRUCTION AND EXAMINATION |
|WITH EFFECT FROM 2010-11 ADMITTED BATCH |
|Sub. |Name of the Subject |Periods |Maximum Marks |Credit|
|Ref. No.| | | |s |
| | |

II/IV B.TECH.(CSE) II - SEMESTER
|B.TECH. (CSE) 2nd YEAR II-SEMESTER SCHEME OF INSTRUCTION AND EXAMINATION |
|WITH EFFECT FROM |
|2010-11 ADMITTED BATCH |
|Sub. |Name of the Subject |Periods |Maximum Marks |Credit|
|Ref. No.| | | |s |
| | |




III/IV B.TECH.(CSE) I - SEMESTER
|B.TECH. (CSE) 3rd YEAR I-SEMESTER SCHEME OF INSTRUCTION AND EXAMINATION WITH|
|EFFECT FROM |
|2010-11 ADMITTED BATCH |
|Sub. |Name of the Subject |Periods |Maximum Marks |Credit|
|Ref. No.| | | |s |
| | |


ELECTIVE-I :
[1]. COMPUTER GRAPHICS, [2]. DIGITAL SIGNAL PROCESSING ,
[3]. FAULT TOLERANT COMPUPTING, [4]. COMBINATORICS &
GRAPHIC THEORY.

III/IV B.TECH.(CSE) II - SEMESTER
|B.TECH. (CSE) 3rd YEAR II-SEMESTER SCHEME OF INSTRUCTION AND EXAMINATION |
|WITH EFFECT FROM |
|2010-11 ADMITTED BATCH |
|Sub. |Name of the Subject |Periods |Maximum Marks |Credit|
|Ref. No.| | | |s |
| | |


ELECTIVE - II
[1]. PRINCIPLES OF PROGRAMMING LANGUAGE [2]. BIO-INFORMATICS [3].
IMAGE PROCESSING. [4]. VHDL
* The industrial training will be for three weeks during the summer after
third year second semester.

IV/IV B.TECH.(CSE) I - SEMESTER
|B.TECH. (CSE) 4th YEAR I-SEMESTER SCHEME OF INSTRUCTION AND EXAMINATION WITH|
|EFFECT FROM |
|2010-11 ADMITTED BATCH |
|Sub. |Name of the Subject |Periods |Maximum Marks |Credit|
|Ref. No.| | | |s |
| | |


ELECTIVE-III :
[1]. EMBEDDED SYSTEMS, [2]. NEURAL NETWORKS & FUZZY LOGIC
[3]. RANDOM PROCESSES IN ENGINEERING.

* The industrial training will be for three weeks during the summer after
third year second semester and assessment will be done in the 4th year
first semester with a seminar on the training he/she got.
.






IV/IV B.TECH.(CSE) II - SEMESTER
|B.TECH. (CSE) 4th YEAR II-SEMESTER SCHEME OF INSTRUCTION AND EXAMINATION |
|WITH EFFECT FROM |
|2010-11 ADMITTED BATCH |
|Sub. |Name of the Subject |Periods |Maximum Marks |Credit|
|Ref. | | | |s |
|No. | | | | |
| | |

ELECTIVE-IV:
[1]DATA WARE HOUSING & DATA MINING ,[2] SERVICE ORIENTED ARCHITECTURE












II/IV B.TECH.(CSE) I - SEMESTER

|B.TECH. (CSE) 2nd YEAR I -SEMESTER SCHEME OF INSTRUCTION AND EXAMINATION |
|WITH EFFECT FROM 2010-11 ADMITTED BATCH |
|Sub. |Name of the Subject |Periods |Maximum Marks |Credit|
|Ref. No.| | | |s |
| | |



CSE 2.1.1 ELECTRONICS Credits:4


Instruction: 3 Periods & 1 Tut /week Sessional
Marks: 30
Univ. Exam : 3 Hours Univ-Exam-Marks:70


I. Semiconductors :
Electronic Emission from metal carrier concentration in
an intrinsic
Semiconductors open circuited PN junction - diffusion.


II. PN Junction Diode :
PN Junction Diode, VI Characteristics of PN Junction Diode,
capacitate effects in
PN Junction Diode, Quantitative theory of PN Junction Diode.


III. Special Devices:
Principles, Working of zero diode, Tunnel diode, Varactor diode,
Schottky diode, SCR and UJT.


IV. Transistors:
The bipolar junction Transistor - Operation of PNP and NPN
Transistors - Transistor Circuit configurations- characteristics
of a CE configurations - h parameter, low frequency small signal
equivalent circuit of a Transistor.


V. Transistor Biasing and thermal stabilization:
Transistor Biasing, stabilization, Different methods of transistor
biasing - Fixed bias, Collector feedback bias - self bias - Bias
compensation.


VI. Field Effect Transistors:
Junction Field Effect Transistors (JFET) - JFET characteristics, JFET
Parameters, Small equivalent circuit - MOSFETS - Depletion and
Enhancement MOSFETS.


VII. Rectifying circuits:
Half wave and full wave rectifiers - Bridge rectifiers - rectifier
efficiency, Ripple and
regulation - Shunt capacitor filter - Zener regulation.


VIII. Transistor Amplifiers:
CE, CB, CC amplifier configurations - Analysis using h- parameters -
Multistage amplifier - RC coupled amplifier - frequency response
curve and bandwidth.


TEXT BOOK:
Electronic Device and Circuits by Sanjeev Gupth.


REFERENCE:
Integrated Electronics by Millman & Halkias.
CSE 2.1.2 ELEMENTS OF ELECTRICAL ENGINEERING Credits:4



Instruction: 3 Periods & 1 Tut / week
Se